Publications Conference paper · 2019

A Wireless Embedded System for Measuring the Effects of Ionizing Radiations

Daniel Sánchez, Pablo A. Ferreyra, Juan A. Fraire, Fabian Gomez, Raoul Velazco, and Dardo Vinas Viscardi

IEEE Latin American Test Symposium (LATS), pp. 1–6, 2019

Abstract

This work presents a new embedded wireless system that allows measuring the effects of ionizing radiation on different electronic devices. The security, reliability and ease of the measurement processes are described by means of an architecture based on wireless monitoring and control fully configurable by the user. All the devices used for the development of the system are low cost and of easy accessibility, such as cell phones or tablets, micro-controllers and Commercial-Off-The-Shelf (COTS) devices. Its application and validation is shown in the study of the counting of singular events in a static RAM exposed to radiation in the TANDAR facility in Buenos Aires, Argentina. Future applications and expected results associated with relevant projects currently underway are also presented.

Cite

DOI 10.1109/latw.2019.8704607

BibTeX

@inproceedings{DBLP:conf/latw/SanchezFFGVV19,
  author    = {Daniel S{\'{a}}nchez and Pablo A. Ferreyra and Juan A. Fraire and Fabian Gomez and Raoul Velazco and Dardo Vinas Viscardi},
  title     = {A Wireless Embedded System for Measuring the Effects of Ionizing Radiations},
  booktitle = {IEEE Latin American Test Symposium (LATS)},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2019},
  doi       = {10.1109/latw.2019.8704607}
}