Publications Conference paper · 2017

Preliminary results of NETFI-2: An automatic method for fault injection on HDL-based designs

M. Solinas, Alexandre Coelho, Juan A. Fraire, Nacer-Eddine Zergainoh, Pablo A. Ferreyra, and Raoul Velazco

IEEE Latin American Test Symposium (LATS), pp. 1–4, 2017

Abstract

Fault injection is a well-known technique to evaluate the susceptibility of integrated circuits to the effects of radiation. In this work, an existing emulation-based methodology is extended, updated and improved under the name of NETFI-2. Preliminary results show that NETFI-2 provides accurate measurements while improving the execution time of the experiment by more than 300% compared with other simulation-based campaigns.

Cite

DOI 10.1109/latw.2017.7906748

BibTeX

@inproceedings{DBLP:conf/latw/SolinasCFZFV17,
  author    = {M. Solinas and Alexandre Coelho and Juan A. Fraire and Nacer{-}Eddine Zergainoh and Pablo A. Ferreyra and Raoul Velazco},
  title     = {Preliminary results of {NETFI-2:} An automatic method for fault injection on HDL-based designs},
  booktitle = {IEEE Latin American Test Symposium (LATS)},
  pages     = {1--4},
  publisher = {{IEEE}},
  year      = {2017},
  doi       = {10.1109/latw.2017.7906748}
}